D13 Nanotomographic Techniques and 3D Material Microstructures

No. Symposia Organiser Co-Organiser
D13 Nanotomographic Techniques and 3D Material Microstructures
Professor Didier Blavette,
Institut Universitaire de France,
Directeur du Groupe de Physique des  Materiaux
(GPM) - UMR CNRS 6634,
Saint Etienne du Rouvray,
France
didier.blavette@univ-rouen.fr (didier NULL.blavette null@null univ-rouen NULL.fr)
Professor Frank Mücklich
Chair Functional Materials
Saarland University, also
Director Material Engineering Center Saarland,
Saarbruecken,
Germanymuecke@matsci.uni-sb.de (muecke null@null matsci NULL.uni-sb NULL.de)
Recent developments in different nanotomographic techniques, namely advanced FIB/SEM serial sectioning techniques and atom probe tomography (APT) significantly increased the understanding of complex materials. Such 3D imaging methods allow the characterization of diverse materials (metals, ceramics, polymers, composites, etc.) on different scales with a resolution down to a few angstroms and sample dimensions up to hundred micrometers. Implementation of available contrast mechanisms and novel image analysis techniques provides essential knowledge for the correlation of the microstructures with processing, properties and even extremely local target preparation and failure analysis. The blossoming of new applications of atom probe tomography in materials science which provides 3D maps of chemical species at the atomic scale indicates its key position in physical metallurgy. It makes it possible to determine the chemical composition in a small region on the nm scale. It is particularly well suited for the investigation of the early stages of decomposition in alloys as well as to investigate interfaces and solute segregation to crystal defects. The specimen preparation techniques using focused ion beam systems have opened the instrument to nanosciences in its whole variety such as spin valve multilayers, nanopowders, ultrathin layers, quantum wells and key materials for microelectronics.The aim of the symposium is to address all different nanotomographic techniques with emphasis on (but not restricted to) advanced serial sectioning strategies and atom probe tomography; to present investigations also based on a combination of different techniques and contrast mechanisms; to show the improvements of 3D image analysis; and thus to provide a bright overview of 3D characterization in the micro, nano and atomic scale. The symposium will cover progress in methods and instrumentation, novel application fields and achieved results in materials science, nanoscience including microelectronics as well as advanced methods of 3D quantitative microstructure analysis.